Functional and circuitry base of control equipment designed for testing large-scale integrated circuits

Abstract

The paper investigates functional and circuitry base used in the development of instrumentation for testing large-scale integrated circuits. Methods for achieving resolution of less than 100 ps with an error of not higher than 10–20 ps are observed. The paper analyses methods of time delay, which can be used for creating digital devices of picosecond range for UHF signals and gives the structure of high-precision digital delay line for UHF range, operating in the 15 ns interval and having the error of not more than 20 ps.