{"title":"Mapping of fields induced by electrical trees in polyethylene","authors":"Y. Serdyuk, Xiangrong Chen, S. Gubanski","doi":"10.1109/CEIDP.2015.7352016","DOIUrl":null,"url":null,"abstract":"A technique for calculating electric field distributions associated with electric trees in polyethylene is presented. The method utilizes images of trees obtained by means of visible-light microscopy and image-to-material conversion for setting up a computational model. Results of calculations of fields induced by various types of single trees in needle-plane electrode system as well as multiple trees in wire-plane system are discussed. For the former, the computed magnitudes of the field strength are compared with those obtained utilizing other advanced imaging techniques.","PeriodicalId":432404,"journal":{"name":"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"131 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.2015.7352016","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A technique for calculating electric field distributions associated with electric trees in polyethylene is presented. The method utilizes images of trees obtained by means of visible-light microscopy and image-to-material conversion for setting up a computational model. Results of calculations of fields induced by various types of single trees in needle-plane electrode system as well as multiple trees in wire-plane system are discussed. For the former, the computed magnitudes of the field strength are compared with those obtained utilizing other advanced imaging techniques.