Enhancement of charge transport in methylammonium lead halide thin films via solvent vapor annealing (Conference Presentation)

Andrew M. Zeidell, Colin Tyznik, L. Jennings, Chuang Zhang, Hyunsu Lee, M. Guthold, Z. Vardeny, O. Jurchescu
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Abstract

In hybrid halide perovskite, the effectiveness of charge transport in relation to film microstructure and processing has remained elusive. In this study we succeeded in tuning grain size and grain boundary chemistry through solvent vapor annealing, which resulted in an increase in charge-carrier mobility by one order of magnitude. To understand the mechanism responsible for the enhanced charge transport, we performed a series of complementary measurements. Atomic force microscopy revealed an increase in grain size and uniformity, and optical microscopy showed a macroscopic reorganization of the film structure. X-ray diffraction measurements of the MAPbI3-xClx films confirmed the removal of preferential orientation after 20 min of solvent annealing at room temperature, in N,N-dimethylformamide. The presence of additional peaks was assigned to the formation of the solvent complex MAI:DMF:PbI2 and the PbI2:DMF ligand, and the content of these phases was monitored as a function of annealing time. Charge-carrier mobility was evaluated from field-effect transistor measurements in devices with gold top contacts and SiO2 bottom-gate dielectric. We obtained ambipolar transport, with both hole and electron mobility exceeding 10cm2/Vs at room temperature. We propose that this remarkable enhancement in electrical properties resulted from an increase in the grain size and passivation of grain boundaries via formation of intermediate solvent complexes formed from unreacted material. This work has allowed us to gain unprecedented insight into the impact of film morphology on charge transport in perovskite materials, an important milestone towards achieving high-performance optoelectronic devices such as transistors, photovoltaics, light emitting diodes, and photodetectors.
溶剂蒸汽退火增强卤化铅甲基铵薄膜中的电荷输运(会议报告)
在杂化卤化物钙钛矿中,电荷输运的有效性与薄膜的微观结构和加工之间的关系仍然是难以捉摸的。在本研究中,我们通过溶剂蒸汽退火成功地调整了晶粒尺寸和晶界化学,从而使载流子迁移率提高了一个数量级。为了了解电荷输运增强的机制,我们进行了一系列补充测量。原子力显微镜显示晶粒尺寸和均匀性增加,光学显微镜显示薄膜结构的宏观重组。MAPbI3-xClx薄膜的x射线衍射测量证实,在N,N-二甲基甲酰胺中,在室温下溶剂退火20分钟后,优先取向被去除。附加峰的存在被认为是溶剂络合物MAI:DMF:PbI2和PbI2:DMF配体的形成,并且这些相的含量作为退火时间的函数被监测。利用场效应晶体管的测量方法,在具有金顶触点和SiO2底栅介质的器件中评估了载流子迁移率。我们获得了双极性输运,在室温下空穴和电子迁移率都超过10cm2/Vs。我们认为,这种显著的电学性能的增强是由于晶粒尺寸的增加和晶界的钝化,这是由未反应的材料形成的中间溶剂络合物形成的。这项工作使我们对钙钛矿材料中薄膜形态对电荷输运的影响有了前所未有的了解,这是实现高性能光电器件(如晶体管、光伏、发光二极管和光电探测器)的重要里程碑。
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