GaN HEMT Model with Enhanced Accuracy under Back-off Operation

V. Vadalà, A. Raffo, K. Kikuchi, Hiroshi Yamamoto, G. Bosi, Kazutaka Inoue, N. Ui, G. Vannini
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Abstract

In this paper, a modification of the Angelov DC I/V model is proposed with the aim of improving its accuracy in the back-off condition under Class-B operation yet preserving its excellent prediction capabilities under high output power and saturated operations. Dispersion effects and capacitances are modelled by well-established techniques. As validation, the predictions of the model on S-parameters and load-pull circles at different bias conditions and different input power levels are shown.
后退操作下精度提高的GaN HEMT模型
本文提出了对Angelov直流I/V模型的改进,目的是提高其在b类工况下退避工况下的精度,同时保持其在高输出功率和饱和工况下的优良预测能力。色散效应和电容由成熟的技术模拟。作为验证,给出了模型在不同偏置条件和不同输入功率下对s参数和负载-拉圆的预测结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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