Jue Wang, M. Cangemi, Jean-Francois Oudard, A. Bean, T. Dunn, C. Lee, Deanna A. Moschitta, Michael John Moore, N. Walker, M. Kapusta, K. Koch
{"title":"Optical Characterization of High Refractive Index Glass Wafers for Augmented Reality Wearables","authors":"Jue Wang, M. Cangemi, Jean-Francois Oudard, A. Bean, T. Dunn, C. Lee, Deanna A. Moschitta, Michael John Moore, N. Walker, M. Kapusta, K. Koch","doi":"10.1364/OIC.2019.THC.3","DOIUrl":null,"url":null,"abstract":"Refractive index and optical thickness homogeneities of 99.979% and 99.984% were determined by using wafer-size metrologies. SiO2 & Nb2O5 based low loss anti-reflective coatings in the visible were realized for augmented reality wearables.","PeriodicalId":119323,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2019","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Interference Coatings Conference (OIC) 2019","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/OIC.2019.THC.3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Refractive index and optical thickness homogeneities of 99.979% and 99.984% were determined by using wafer-size metrologies. SiO2 & Nb2O5 based low loss anti-reflective coatings in the visible were realized for augmented reality wearables.