Sleepy lector: A novel approach for leakage reduction in DSM technology

Ajay Kumar Dadoria, K. Khare, R. Singh
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引用次数: 7

Abstract

Leakage power consumption is a major contribution of total power dissipation in Deep Sub-Micron (DSM) technology for CMOS circuit design. In this paper we have proposed a Novel circuit technique known as “Sleepy LECTOR” which mitigates various type of leakage current in DSM regime. In proposed technique we insert p-type sleep transistor above pull up network, and n-type sleep transistor below pull down network, which rail of from Vdd to GND for reduction of leakage power. Another Leakage controlled transistor (LCTs) PMOS and NMOS inserted between pull up and pull down network, these transistors are always near cut OFF voltage which increases the path resistance from supply to ground reducing leakage power, it is self controlling transistor. Lector transistors produce the stacking effect and producing high resistance path from Vdd to ground. By using Sleep transistors we can turn off the circuit by rail from power supply (Vdd) during standby mode for reduction of leakage power. The proposed circuit technique reduces the Power with respect to basic NAND gate 37.69%, 83.93%, N AND gate with sleep 79.15%, 86.69%, NAND gate with Lector 36.79%, 12.05% respectively in 65nm and 45nm Process Technology.
睡眠收集器:在DSM技术中减少泄漏的一种新方法
在深亚微米(DSM) CMOS电路设计中,漏功耗是总功耗的主要贡献。在本文中,我们提出了一种新的电路技术,称为“休眠收集器”,它减轻了DSM制度下各种类型的泄漏电流。在该技术中,我们在上拉网络上方插入p型休眠晶体管,在下拉网络下方插入n型休眠晶体管,从Vdd到地轨,以减少漏功率。另一种漏电控制晶体管(lts)是PMOS和NMOS,插入在上拉和下拉网络之间,这些晶体管总是接近截止电压,从而增加了从电源到地的路径电阻,减少了泄漏功率,是一种自控制晶体管。电极晶体管产生叠加效应,产生从Vdd到地的高阻路径。通过使用休眠晶体管,我们可以在待机模式下从电源(Vdd)断开电路,以减少漏电。该电路技术在65nm和45nm工艺下,功耗分别比基本NAND门降低37.69%、83.93%,比带睡眠的N与门降低79.15%、86.69%,比带电极的NAND门降低36.79%、12.05%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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