Alternative conducted emission measurements with LISN simulation & CISPR 16 Voltage Probe

O. Sen, S. Cakir, S. Acak, M. Çetintaş
{"title":"Alternative conducted emission measurements with LISN simulation & CISPR 16 Voltage Probe","authors":"O. Sen, S. Cakir, S. Acak, M. Çetintaş","doi":"10.1109/ISEMC.2015.7256348","DOIUrl":null,"url":null,"abstract":"Conducted emission tests are always performed by the use of LISNs in laboratories in accordance with CISPR22, CISPR11 and other similar standards. However, it is not always possible to use LISNs because of some limitations. If the Equipment Under Test (EUT) has large dimensions or high currents, it is not, for most of the time, possible to send it to an EMC laboratory or to use LISNs during the test. As a consequence, usage or development of alternative conducted emission test methods are inevitable in industry. In this paper, we investigated the use of LISN simulations constructed with long ordinary cables, capacitors and resistors instead of actual LISNs. In addition, we also improved the usage of CISPR16 Voltage Probe by combining it with impedance measurements of EUT, supply and used cables.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"26 8","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2015.7256348","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Conducted emission tests are always performed by the use of LISNs in laboratories in accordance with CISPR22, CISPR11 and other similar standards. However, it is not always possible to use LISNs because of some limitations. If the Equipment Under Test (EUT) has large dimensions or high currents, it is not, for most of the time, possible to send it to an EMC laboratory or to use LISNs during the test. As a consequence, usage or development of alternative conducted emission test methods are inevitable in industry. In this paper, we investigated the use of LISN simulations constructed with long ordinary cables, capacitors and resistors instead of actual LISNs. In addition, we also improved the usage of CISPR16 Voltage Probe by combining it with impedance measurements of EUT, supply and used cables.
使用LISN仿真和CISPR 16电压探头进行替代发射测量
进行的发射测试总是按照CISPR22、CISPR11和其他类似标准,在实验室中使用lisn进行。然而,由于一些限制,并不总是可以使用lisn。如果被测设备(EUT)尺寸大或电流大,在大多数情况下,不可能将其送到EMC实验室或在测试期间使用lisn。因此,在工业中不可避免地要使用或开发替代的传导排放测试方法。在本文中,我们研究了使用长普通电缆,电容器和电阻来代替实际的LISN模拟。此外,我们还通过将CISPR16电压探头与EUT、电源和使用电缆的阻抗测量相结合,改进了CISPR16电压探头的使用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信