Conventional Transistor Non-Linear Model Extraction/Verification using Time Domain Microwave Waveform Measurements

Abstract

Integration of an NLVNA measurement system with appropriate arbitrary waveform voltage stimuli hardware provides for large signal measurements that can be used to both verify and extract conventional transistor non-linear models. As a verification tool, they can be used not only to quantify model accuracy but also to aid directly in identifying model problems and deficiencies. In model generation they can be used as a replacement for bias dependent small signal s-parameters during model extraction/optimisation. Alternatively, if properly selected these voltage stimuli can be transformed directly into the required state-functions.