Reliability Evaluation of Flip-Flops Based on Probabilistic Transfer Matrices

Abstract

To estimate the reliability and find the weak point of circuits at design phase, several high-level evaluation methods have been proposed recently. However, most of these methods can only be used for combinational circuits. In this paper, we propose a reliability evaluation method based on probabilistic transfer matrices to accurately estimate the reliability of a flip flop circuit. The proposed method is compared with the method in [7] for the D-type flip-flop. Experimental results confirmed that our method is accurate.