C. Charette, S. Park, R. Williams, B. Banhabib, K. smith
{"title":"Development and integration of a microcomputer based image analysis system for automatic PCB inspection","authors":"C. Charette, S. Park, R. Williams, B. Banhabib, K. smith","doi":"10.1109/CIM.1988.5402","DOIUrl":null,"url":null,"abstract":"Completely repeatable inspection of printed circuit boards (PCBs) requires that the inspection be automated. The cost of such inspection is beyond most medium to small PCB manufacturers. The authors address this problem with a microcomputer-based image-analysis system. Illumination, filtering, and flaw detection of the IBM-AT-based system are addressed. The authors conclude that when processing costs are reduced, the system will be viable and cost-effective.<<ETX>>","PeriodicalId":334994,"journal":{"name":"[Proceedings] 1988 International Conference on Computer Integrated Manufacturing","volume":"76 3","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[Proceedings] 1988 International Conference on Computer Integrated Manufacturing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CIM.1988.5402","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
Completely repeatable inspection of printed circuit boards (PCBs) requires that the inspection be automated. The cost of such inspection is beyond most medium to small PCB manufacturers. The authors address this problem with a microcomputer-based image-analysis system. Illumination, filtering, and flaw detection of the IBM-AT-based system are addressed. The authors conclude that when processing costs are reduced, the system will be viable and cost-effective.<>