{"title":"Synthesis and Characterization of Nano Crystalline Mg0.5Zn0.5Fe2O4 Prepared by Co-Precipitation Method","authors":"P. Krishna, T. Dayakar, C. P. Vardhini","doi":"10.30799/jnst.117.18040310","DOIUrl":null,"url":null,"abstract":"Mg 0.5 Zn 0.5 Fe 2 O 4 nano crystalline were successfully prepared by employing the co-precipitation method. From XRD it has been fulfilled that single phase spinel structure has been formed at sintering temperature at 900 °C. The particle sizes are in the range of 30 to 40 nm calculated from XRD and SEM graphs. The Mg 0.5 Zn 0.5 Fe 2 O 4 powders prepared at low temperature exhibit good crystal structure, fine grain size and good magnetic properties. The dielectric constant and dielectric loss of sample have shown good frequency stability and low dielectric losses within the measurement range.","PeriodicalId":187599,"journal":{"name":"Journal of Nanoscience and Technology","volume":"12 5","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Nanoscience and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.30799/jnst.117.18040310","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Mg 0.5 Zn 0.5 Fe 2 O 4 nano crystalline were successfully prepared by employing the co-precipitation method. From XRD it has been fulfilled that single phase spinel structure has been formed at sintering temperature at 900 °C. The particle sizes are in the range of 30 to 40 nm calculated from XRD and SEM graphs. The Mg 0.5 Zn 0.5 Fe 2 O 4 powders prepared at low temperature exhibit good crystal structure, fine grain size and good magnetic properties. The dielectric constant and dielectric loss of sample have shown good frequency stability and low dielectric losses within the measurement range.