B. Harms, R. Dyer, S. Dyer, T. W. Johnson, J.B. Park
{"title":"An introduction to Hadamard spectrometry and the multiplex advantage","authors":"B. Harms, R. Dyer, S. Dyer, T. W. Johnson, J.B. Park","doi":"10.1109/IMTC.1989.36899","DOIUrl":null,"url":null,"abstract":"The authors consider a special class of problems in which the dominant noise source in the spectrum measurements is the noise generated in the detector itself. In this case, the signal-to-noise ratio of the spectrum estimates can be improved by a multiplexing technique known as Hadamard spectrometry. Specifically, if the MSE (mean-square error) of a single-slit spectrometer is sigma /sup 2/, the MSE of a Hadamard system will be approximately 4/ sigma /sup 2//N. In this expression, N is the number of spectral components to be estimated and the number of measurements to be taken.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"123 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1989.36899","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
The authors consider a special class of problems in which the dominant noise source in the spectrum measurements is the noise generated in the detector itself. In this case, the signal-to-noise ratio of the spectrum estimates can be improved by a multiplexing technique known as Hadamard spectrometry. Specifically, if the MSE (mean-square error) of a single-slit spectrometer is sigma /sup 2/, the MSE of a Hadamard system will be approximately 4/ sigma /sup 2//N. In this expression, N is the number of spectral components to be estimated and the number of measurements to be taken.<>