Vulnerability of Smart Grid-based Protection Systems to Ultra-Wide Band IEMI Sources

F. Arduini, M. Suhrke, T. Pusch, H. Garbe
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Abstract

The threat of IEMI to power infrastructures has been growing in concern by experts and authorities worldwide. This is due to the increased integration of smart electronic devices (SEDs), whose microprocessor systems may be vulnerable to high-power electromagnetic interference. One possible gateway for such attacks is the digital protection relays employed to protect power substations. The malfunctioning of these devices could lead to equipment damage (e.g., power transformers) and cascading of blackout events. This paper presents a vulnerability study of a protection system with three different cable topologies subjected to a high-power radiated interfering source. The results showed that variations in the wiring topology would affect the protection system's incidence rate of critical failures when exposed to Ultra Wide Band (UWB) pulses.
基于智能电网的防护系统对超宽带IEMI源的脆弱性研究
电磁干扰对电力基础设施的威胁日益受到世界各国专家和当局的关注。这是由于智能电子设备(sed)的集成增加,其微处理器系统可能容易受到高功率电磁干扰。这种攻击的一个可能的网关是用于保护变电站的数字保护继电器。这些设备的故障可能导致设备损坏(例如,电力变压器)和连锁停电事件。本文研究了具有三种不同电缆拓扑结构的保护系统在高功率辐射干扰源作用下的脆弱性。结果表明,在超宽带(UWB)脉冲环境下,布线拓扑结构的变化会影响保护系统的临界故障发生率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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