{"title":"Dynamic Simulation and Testing of the Electrode-Electrolyte Interface of 3-D Stimulating Microelectrodes","authors":"A. Hung, D. Zhou, R. Greenberg, J. Judy","doi":"10.1109/CNE.2005.1419584","DOIUrl":null,"url":null,"abstract":"Traditional simulations of current distribution for neuralelectrodes have been based on steady-state, resistive-only models that predict severe current crowding at sharp electrode topologies. In contrast, this work presents time-stepping calculations performed with SPICE and ANSYS that can accurately reflect the capacitive behavior of neuralelectrodes. The simulations display that at the electrode-electrolyte interface, the current distribution exhibits a variation of <10%. While current crowding is observed in the solution adjacent to sharp convex edges, the current at these sites is found to be parallel to the electrode surface, and is not expected to contribute to electrode corrosion. Preliminary dissolution studies at 50 muC/cm 2 shows an isometric dissolution pattern, confirming the predicted uniform current density","PeriodicalId":113815,"journal":{"name":"Conference Proceedings. 2nd International IEEE EMBS Conference on Neural Engineering, 2005.","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Proceedings. 2nd International IEEE EMBS Conference on Neural Engineering, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CNE.2005.1419584","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Traditional simulations of current distribution for neuralelectrodes have been based on steady-state, resistive-only models that predict severe current crowding at sharp electrode topologies. In contrast, this work presents time-stepping calculations performed with SPICE and ANSYS that can accurately reflect the capacitive behavior of neuralelectrodes. The simulations display that at the electrode-electrolyte interface, the current distribution exhibits a variation of <10%. While current crowding is observed in the solution adjacent to sharp convex edges, the current at these sites is found to be parallel to the electrode surface, and is not expected to contribute to electrode corrosion. Preliminary dissolution studies at 50 muC/cm 2 shows an isometric dissolution pattern, confirming the predicted uniform current density
传统的神经电极电流分布模拟是基于稳态、纯电阻模型来预测尖锐电极拓扑上的严重电流拥挤。相比之下,这项工作提出了用SPICE和ANSYS进行的时间步进计算,可以准确地反映神经电极的电容行为。模拟结果表明,在电极-电解质界面处,电流分布的变化小于10%。虽然在尖锐凸边附近的溶液中观察到电流拥挤,但发现这些位置的电流与电极表面平行,并且预计不会导致电极腐蚀。在50 μ c / cm2下的初步溶解研究显示出等长溶解模式,证实了预测的均匀电流密度