Investigation of Sideway Coupling Effects of Virtual Ground in Three Types of Coupled Line with Mixed-mode Stimuli

L. Hwang, C. Wang, Ming-Yuan Huang, Hung-Chih Lin, Chien-Chang Huang
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Abstract

Some suggested that four-port single-ended scattering S-parameters (simulated or measured) be converted and used to represent mixed-mode S-parameters; the approach we label here as "SE-matrix converted," or simply "SE-conv." SE-conv is often preferred, since the mixed-mode signal sources and probes are not readily or easily available. To employ the SE-conv formulation, the two lines have to be loosely coupled. This restriction curtails in differential bias in the mixed-mode feeding the considerations of 1) existence of virtual ground, and 2) defect ground that may be present in the system ground. First, when the virtual ground existing between lines is not considered (due to loosely coupling assumption), detailed capacitive referencing (line held at +V to virtual ground, and virtual ground to other line held at –V in differential feed) is thus ignored. Three CPL configurations were employed here to investigate the impacts of close coupling, including the effect of virtual ground and its associated capacitive referencing. The progress is reported in this paper. Secondly, effects of ground defect is directly picked up by SE feeding, while in mixed-mode feeding, the effect is somehow reduced (or resisted) by the virtual ground. The investigation on this issue is in progress, and we will report the results later. Keywords— CPL (Coupled Line), Single-ended and mixed-mode feeds, Differential & common mode stimuli, Coupled line, Stripline, Microstrip, and Co-planar ground, Virtual ground, Defect ground, Scattering parameters, Network analyzer
三种混合模式耦合线路中虚拟地面横向耦合效应的研究
有人建议将模拟或实测的四端口单端散射s参数转换为混合模式s参数;我们在这里把这种方法称为“se矩阵转换”,或者简称为“SE-conv”。SE-conv通常是首选,因为混合模式信号源和探头不容易或容易获得。要使用SE-conv公式,两条线必须是松耦合的。这种限制限制了混合模式馈电中的差分偏置,考虑到1)虚拟地的存在,以及2)系统接地中可能存在的缺陷地。首先,当不考虑线路之间存在的虚拟地时(由于松耦合假设),因此忽略了详细的电容参考(在差分馈电中保持在+V的线路到虚拟地,以及虚拟地到其他保持在-V的线路)。本文采用三种CPL结构来研究紧密耦合的影响,包括虚拟地及其相关电容参考的影响。本文报道了这方面的研究进展。其次,接地缺陷的影响是由SE馈电直接拾取的,而在混合馈电中,这种影响在某种程度上被虚拟接地降低(或抵抗)。关于这个问题的调查正在进行中,稍后我们会报告结果。关键词:CPL(耦合线),单端和混合模式馈电,差分和共模刺激,耦合线,带状线,微带,共面地,虚拟地,缺陷地,散射参数,网络分析仪
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