{"title":"Statistical learning and VC theory","authors":"P. Bartlett","doi":"10.1109/TUTCAS.2001.946954","DOIUrl":null,"url":null,"abstract":"The article applies statistical learning theory to the supervised learning problem. Pattern recognition is covered, including Vapnik-Chervonenkis (VC) theory and the implications for support vector machines (SVMs), neural networks and decision trees. Real predictions are given for scale-sensitive dimensions. The article concludes by analysing large margin classification.","PeriodicalId":376181,"journal":{"name":"Tutorial Guide. ISCAS 2001. IEEE International Symposium on Circuits and Systems (Cat. No.01TH8573)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Tutorial Guide. ISCAS 2001. IEEE International Symposium on Circuits and Systems (Cat. No.01TH8573)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TUTCAS.2001.946954","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
The article applies statistical learning theory to the supervised learning problem. Pattern recognition is covered, including Vapnik-Chervonenkis (VC) theory and the implications for support vector machines (SVMs), neural networks and decision trees. Real predictions are given for scale-sensitive dimensions. The article concludes by analysing large margin classification.