{"title":"Traceable measurement of Error Vector Magnitude (EVM) in WCDMA signals","authors":"D. Humphreys, R. T. Dickerson","doi":"10.1109/WDDC.2007.4339424","DOIUrl":null,"url":null,"abstract":"This is the first report of a methodology to provide national standards traceability for EVM measurement of WCDMA RF sources using waveform metrology techniques. The method uses sampling oscilloscopes or real-time digital oscilloscopes. Preliminary results indicate that the rms uncertainty of the modulation waveform, at 95% confidence, is less than 0.3 %.","PeriodicalId":142822,"journal":{"name":"2007 International Waveform Diversity and Design Conference","volume":"111 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"26","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 International Waveform Diversity and Design Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WDDC.2007.4339424","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 26
Abstract
This is the first report of a methodology to provide national standards traceability for EVM measurement of WCDMA RF sources using waveform metrology techniques. The method uses sampling oscilloscopes or real-time digital oscilloscopes. Preliminary results indicate that the rms uncertainty of the modulation waveform, at 95% confidence, is less than 0.3 %.