MEMS-based piezoelectric micro cantilever using LaNiO3 buffered PZT thin film

T. Kobayashi, R. Kondo, K. Nakamura, M. Ichiki, R. Maeda
{"title":"MEMS-based piezoelectric micro cantilever using LaNiO3 buffered PZT thin film","authors":"T. Kobayashi, R. Kondo, K. Nakamura, M. Ichiki, R. Maeda","doi":"10.1109/ISAF.2007.4393381","DOIUrl":null,"url":null,"abstract":"We have fabricated piezoelectric micro cantilevers using LaNiO3 (LNO) buffered PZT thin film through microelectromechanical systems (MEMS) micro fabrication process. The micro cantilevers have been fabricated from Pt/Ti/LNO/PZT/LNO/Pt/Ti/SiO2 or Pt/Ti/PZT/Pt/Ti/SiO2 multilayers deposited on SOI wafers. The PZT thin films without LNO thin films were degraded through the MEMS micro fabrication process. We have found that the LNO thin films can avoid the degradation. DC actuation of the micro cantilevers using LNO buffered PZT thin films has resulted in symmetric butterfly curve. The transverse piezoelectric constant of LNO buffered PZT thin films (-d31 = 120 pm/V) is higher than that of the PZT thin films without LNO thin films (70 pm/V).","PeriodicalId":321007,"journal":{"name":"2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics","volume":"116 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.2007.4393381","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

We have fabricated piezoelectric micro cantilevers using LaNiO3 (LNO) buffered PZT thin film through microelectromechanical systems (MEMS) micro fabrication process. The micro cantilevers have been fabricated from Pt/Ti/LNO/PZT/LNO/Pt/Ti/SiO2 or Pt/Ti/PZT/Pt/Ti/SiO2 multilayers deposited on SOI wafers. The PZT thin films without LNO thin films were degraded through the MEMS micro fabrication process. We have found that the LNO thin films can avoid the degradation. DC actuation of the micro cantilevers using LNO buffered PZT thin films has resulted in symmetric butterfly curve. The transverse piezoelectric constant of LNO buffered PZT thin films (-d31 = 120 pm/V) is higher than that of the PZT thin films without LNO thin films (70 pm/V).
基于mems的压电微悬臂梁采用LaNiO3缓冲PZT薄膜
采用微机电系统(MEMS)微加工工艺,利用LaNiO3 (LNO)缓冲PZT薄膜制备了压电微悬臂梁。采用Pt/Ti/LNO/PZT/LNO/Pt/Ti/SiO2或Pt/Ti/PZT/Pt/Ti/SiO2多层沉积在SOI晶片上制备微悬臂梁。采用MEMS微加工工艺对PZT薄膜进行了降解。我们发现LNO薄膜可以避免这种退化。利用LNO缓冲PZT薄膜对微悬臂梁进行直流驱动,形成了对称的蝴蝶曲线。LNO缓冲PZT薄膜的横向压电常数(-d31 = 120 pm/V)高于无LNO缓冲PZT薄膜的横向压电常数(70 pm/V)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信