{"title":"Discovery of the tri-edge inequality with binary vector dissimilarity measures","authors":"Bin Zhang, S. Srihari","doi":"10.1109/ICPR.2004.1333861","DOIUrl":null,"url":null,"abstract":"In certain spaces using some distance measures, the sum of any two distances is always bigger than the third one. Such a special property is called the tri-edge inequality (TEI). In this paper, the tri-edge inequality characterizing several binary distance measures is mathematically proven and experimentally verified, and the implications of TEI are discussed as well.","PeriodicalId":335842,"journal":{"name":"Proceedings of the 17th International Conference on Pattern Recognition, 2004. ICPR 2004.","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-08-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 17th International Conference on Pattern Recognition, 2004. ICPR 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICPR.2004.1333861","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
In certain spaces using some distance measures, the sum of any two distances is always bigger than the third one. Such a special property is called the tri-edge inequality (TEI). In this paper, the tri-edge inequality characterizing several binary distance measures is mathematically proven and experimentally verified, and the implications of TEI are discussed as well.