Virtual test reduces semiconductor product development time

Abstract

In the semiconductor industry's evolutionary life cycle, the speed at which products are introduced to the market-place is key to the competitive success of individual companies. The semiconductor industry is classed as a fast-changing industry in which product technology, manufacturing process technology and industry organisation need to be continuously updated in relatively short cycle times. This paper looks at the test engineering aspect of the IC (integrated circuit) product development process and describes how an emerging 'virtual test' methodology can be effectively applied to reduce the overall product development time for semiconductor devices.