Convective Heat Transfer From a Stacked Electronic Package

V. Natarajan
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引用次数: 4

Abstract

Convective heat transfer from a vertically stacked (3D) electronic package (package-on-package) mounted in between two circuit boards is numerically investigated. Heat transfer and pressure loss characteristics of single chip packages and multiple-chip packages (P-O-P) for both two and four package stack are presented and compared. The package Reynolds number, based on the package height and upstream velocity, ranges from 150 to about 1000. Two channel heights are investigated, a large channel (with bypass > 5B, B is package height) and a small channel (with a bypass = B). The effect of board conduction on the heat transfer performance from the package is also quantified. A surprising finding is that, in the present set of configurations, the heat transfer for a multi-package stack, such as a two-package stack or a four-package stack, can be reasonably predicted using the heat transfer information from a single chip package by employing a simple scalar factor. Finally, the effects of non-uniform heating on the die temperatures of the different packages in a stack are examined
堆叠电子封装的对流传热
对安装在两个电路板之间的垂直堆叠(3D)电子封装(封装对封装)的对流传热进行了数值研究。对单芯片封装和多芯片封装(P-O-P)在两层和四层封装下的传热和压力损失特性进行了比较。根据包体高度和上游速度,包体雷诺数在150到1000左右。研究了两个通道高度,一个大通道(旁路> 5B, B为封装高度)和一个小通道(旁路= B)。还量化了板传导对封装传热性能的影响。一个令人惊讶的发现是,在目前的一组配置中,多封装堆栈(如双封装堆栈或四封装堆栈)的传热可以通过使用简单的标量因子来合理地预测来自单个芯片封装的传热信息。最后,研究了不均匀加热对一堆不同封装的模具温度的影响
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