The Structure and Magnetic Properties of CoNbZr-Sm2O3 Granular Films

Abstract

In this study, granular films were prepared by reactive RF magnetron sputtering. The film was deposited on Si (100) substrates. The magnetic properties (coercivity) were measured by a vibrating sample magnetometer (VSM). The electrical resistivity (p) of the thin film was determined by means of a four-point probe method. The film structures were investigated by X-ray diffractometry (XRD) and transmission electron microscopy (TEM).