A. Mihaila, L. Knoll, E. Bianda, M. Bellini, S. Wirths, G. Alfieri, L. Kranz, F. Canales, Munaf T. A. Rahimo
{"title":"The current status and future prospects of SiC high voltage technology","authors":"A. Mihaila, L. Knoll, E. Bianda, M. Bellini, S. Wirths, G. Alfieri, L. Kranz, F. Canales, Munaf T. A. Rahimo","doi":"10.1109/IEDM.2018.8614480","DOIUrl":null,"url":null,"abstract":"This paper reviews the recent progress of SiC MOSFETs rated above 3.3kV. The static and dynamic performance of 3.3 and 6.5kV-rated MOSFETs will be evaluated and benchmarked against similarly rated state-of-the-art Si IGBTs. A numerical comparison between high voltage (15kV) SiC MOSFETs and IGBTs will also be provided. The paper will also attempt to comment on the future challenges facing high voltage (HV) devices in SiC technology.","PeriodicalId":152963,"journal":{"name":"2018 IEEE International Electron Devices Meeting (IEDM)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2018.8614480","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
This paper reviews the recent progress of SiC MOSFETs rated above 3.3kV. The static and dynamic performance of 3.3 and 6.5kV-rated MOSFETs will be evaluated and benchmarked against similarly rated state-of-the-art Si IGBTs. A numerical comparison between high voltage (15kV) SiC MOSFETs and IGBTs will also be provided. The paper will also attempt to comment on the future challenges facing high voltage (HV) devices in SiC technology.