Characterization of In-Plane Resonant Cavities with Photonic Crystal Boundaries Etched in InP-Based Heterostructure

2002 28TH European Conference on Optical Communication Pub Date : 2003-08-05 DOI:10.1063/1.1594824

M. Mulot, M. Qiu, M. Swillo, S. Anand, B. Jaskorzyńska, A. Talneau

引用次数: 21

Abstract

In-plane cavities with photonic crystal boundaries are realized in InP/InGaAsP/InP slab waveguides. A quality factor of 400 for a 6 mum long cavity with 6-hole mirrors is measured. The quality of the photonic crystals are investigated by fitting transmission spectra with 2D finite-difference time-domain simulations

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基于inp的异质结构中蚀刻光子晶体边界的面内谐振腔的表征

在InP/InGaAsP/InP平板波导中实现了具有光子晶体边界的面内腔。测量了带有6孔反射镜的6微米长腔的质量系数为400。利用二维时域有限差分模拟方法拟合光子晶体的透射光谱，研究了光子晶体的性质

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2002 28TH European Conference on Optical Communication

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