Low-Capacitance Integrated Silicon Finger Photodetector

W. Gaberl, H. Zimmermann
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引用次数: 2

Abstract

Results of a low capacitance design for integrated silicon photodiodes are presented. The diodes use n+-doped finger cathodes as well as p+-fingers. With this design it is possible to lower the capacitance compared to homogenous photodiodes (vertical PIN photodiode structure). Low capacitances are reached even at low bias voltages of around 2 V. The diodes reach a responsivity of R=0.24A/W (0.45A/W) at a wavelength of 410 nm (660 nm). The diode design aims at applications where maximum sensitivity, i.e. lowest noise, and therefore low photodiode capacitance is needed. The photodiodes were realized in a 0.6mum BiCMOS process
低电容集成硅指光电探测器
介绍了一种集成硅光电二极管的低电容设计结果。二极管使用掺n+的指形阴极和p+指形阴极。与均匀光电二极管(垂直PIN光电二极管结构)相比,这种设计可以降低电容。即使在2v左右的低偏置电压下也能达到低电容。在410 nm (660 nm)波长处,二极管的响应度R=0.24A/W (0.45A/W)。二极管设计的目的是应用在最大的灵敏度,即最低的噪声,因此需要低光电二极管电容。光电二极管在0.6 μ m的BiCMOS工艺中实现
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