Mechanical characterization of nanowires by planar vibration sensor

Lulu Zhang, Jian Lu, H. Takagi, R. Maeda
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Abstract

Nanowires have attracted considerable interest as the nanoscale interconnects and as the moving elements of both electronic and electromechanical devices. The evaluation of nanomechanical property plays a significant role in the development of new nanowire-based devices. Recently, we are engaged in developing an easy method for nanomechanical measurement by using an in-plane-mode piezoresistive vibration sensor fabricated with less process cost and package difficulties. Theoretical analysis and simulation results suggested that the device is capable of high-sensitive and variety, and it is expected to evaluate mechanical properties of metallic or metallic oxide nanowires.
基于平面振动传感器的纳米线力学特性研究
纳米线作为纳米级互连和电子和机电设备的移动元件引起了人们的极大兴趣。纳米力学性能的评价对新型纳米线器件的开发具有重要意义。最近,我们致力于开发一种简单的纳米力学测量方法,即使用平面内模压阻振动传感器,该传感器具有较少的工艺成本和封装困难。理论分析和仿真结果表明,该装置具有高灵敏度和多样性,有望用于评价金属或金属氧化物纳米线的力学性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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