M. Weiss, M. Crites, E. Bryerton, J. Whitaker, Z. Popovic
{"title":"Time-domain optical sampling of nonlinear microwave amplifiers","authors":"M. Weiss, M. Crites, E. Bryerton, J. Whitaker, Z. Popovic","doi":"10.1109/MWSYM.1999.779529","DOIUrl":null,"url":null,"abstract":"Time domain measurements of the output waveforms of two 8-GHz high-efficiency power amplifiers are presented. A new photoconductive probe has enabled nonintrusive absolute voltage measurements which confirm switched-mode class-E and F operation. In order to analyze nonlinear amplifiers designed to deliver a sinusoidal wave to the load, voltages at characteristic points inside the circuit need to be known. The high-impedance probe used here is an optoelectronic sampler which can sense the charge on an exposed interconnect or the field associated with a buried interconnect. This field data is then converted into voltage.","PeriodicalId":339267,"journal":{"name":"1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1999.779529","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Time domain measurements of the output waveforms of two 8-GHz high-efficiency power amplifiers are presented. A new photoconductive probe has enabled nonintrusive absolute voltage measurements which confirm switched-mode class-E and F operation. In order to analyze nonlinear amplifiers designed to deliver a sinusoidal wave to the load, voltages at characteristic points inside the circuit need to be known. The high-impedance probe used here is an optoelectronic sampler which can sense the charge on an exposed interconnect or the field associated with a buried interconnect. This field data is then converted into voltage.