Jack H. Arabian
{"title":"Manufacturing Test","authors":"Jack H. Arabian","doi":"10.1201/9781003065944-6","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":422271,"journal":{"name":"Computer Integrated Electronics Manufacturing and Testing","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Computer Integrated Electronics Manufacturing and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9781003065944-6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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