Fabrication of Single Crystalline Zn0.85Cu0.15O Film Using CWD Coating Technique

A. Das, S. Kamilla, P. Pattanaik, D. Mishra, Rinkee Das
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Abstract

On view of several potential applications in the field of spintronics, optoelectronics and sensor-based devices; undoped and doped ZnO has been attracting a lot of attention to fabricate high quality single crystalline thin films. It is also essential to fabricate good quality and highly reproducible film with low cost. Taking this into view, we have synthesized Cu doped ZnO (Zn0.85Cu0.15O) by chemical wet and dry (CWD) coating technique indigenously developed in our lab. The developed set up has in-situ annealing facility for which post annealing is not required. In the beginning, highly pure Cu doped ZnO powders were synthesized by chemical route which is completely polycrystalline in nature. Then these polycrystalline powders were considered for preparation of solution with various molar concentrations, for fabrication of film of Cu doped ZnO. The synthesis parameters like driving speed of the gear for vertical movement of the substrate and molar concentration of solution were varied. It is observed from the XRD pattern that the synthesized film has grown in a particular orientation to form a layer which is single crystalline in nature. The electrical characterization has been carried out by Hall effect measurement set up.
CWD镀膜技术制备Zn0.85Cu0.15O单晶薄膜
展望了其在自旋电子学、光电子学和传感器器件等领域的应用前景;未掺杂和掺杂氧化锌是制备高质量单晶薄膜的研究热点。以低成本制造高质量、高再现性的薄膜也是至关重要的。鉴于此,我们利用自主开发的化学干湿包覆技术合成了Cu掺杂ZnO (Zn0.85Cu0.15O)。开发的装置有原位退火设备,不需要后退火。首先,采用化学方法合成了高纯度Cu掺杂ZnO粉体,其性质为完全多晶。然后考虑将这些多晶粉末用于制备不同摩尔浓度的溶液,用于制备Cu掺杂ZnO薄膜。改变了底物垂直运动齿轮驱动速度和溶液摩尔浓度等合成参数。从XRD图中观察到,合成的薄膜沿特定的取向生长,形成了一层单晶性质的薄膜。利用霍尔效应测量装置进行了电学表征。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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