{"title":"Mission relevant testing","authors":"M. Lopez, M. Horman, T. Luu, H. Orlando","doi":"10.1109/NAECON.1993.290809","DOIUrl":null,"url":null,"abstract":"A methodology for determining test criteria based on specific mission requirements has been developed which allows greater flexibility in setting pass/fail criteria for automated testing. The rationale for the introduction of mission relevant testing is given along with an illustrative example of its use. The example shows how mission relevant testing can be useful in providing pass/fail criteria which maximizes the utility of sensor systems in specific missions.<<ETX>>","PeriodicalId":183796,"journal":{"name":"Proceedings of the IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NAECON.1993.290809","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A methodology for determining test criteria based on specific mission requirements has been developed which allows greater flexibility in setting pass/fail criteria for automated testing. The rationale for the introduction of mission relevant testing is given along with an illustrative example of its use. The example shows how mission relevant testing can be useful in providing pass/fail criteria which maximizes the utility of sensor systems in specific missions.<>