R. Desplats, G. Faggion, F. Beaudoin, P. Perdu, T. Lundquist, K. Shah, A. Chion, M. Vallet, P. Sardin
{"title":"A new approach for faster IC analysis with PICA: STPC-3D","authors":"R. Desplats, G. Faggion, F. Beaudoin, P. Perdu, T. Lundquist, K. Shah, A. Chion, M. Vallet, P. Sardin","doi":"10.1109/IPFA.2003.1222736","DOIUrl":null,"url":null,"abstract":"To reduce acquisition time with PICA (Picosecond Imaging Circuit Analysis), we have developed a Spatial Temporal Photon Correlation approach (STPC-3D) which reduces acquisition from hours to minutes. Applications are presented on several devices (i.e., Azuma 0.18 /spl mu/m-1.8 V, Lazarus 0.18 /spl mu/m-1.8 V and STm 0.12 /spl mu/m-1.2 V) showing transistors and their commutations.","PeriodicalId":266326,"journal":{"name":"Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2003-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2003.1222736","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
To reduce acquisition time with PICA (Picosecond Imaging Circuit Analysis), we have developed a Spatial Temporal Photon Correlation approach (STPC-3D) which reduces acquisition from hours to minutes. Applications are presented on several devices (i.e., Azuma 0.18 /spl mu/m-1.8 V, Lazarus 0.18 /spl mu/m-1.8 V and STm 0.12 /spl mu/m-1.2 V) showing transistors and their commutations.