Frustum ray tracing technique for high spatial resolution channel characteristic map

Abstract

A novel frustrum ray tracing technique is introduced that utilizes a fast line clipping algorithm rather than the conventional time-consuming ray intersection test algorithm. The usefulness of the technique in predicting channel characteristic maps with high spatial (one fifth of wavelength) resolution incorporating hundreds of thousands receiving points in a complex in-building environment is demonstrated by results predicted by a software program that runs on a typical PC.