A very high current, wide bandwidth voltage source for microprocessor testing

Abstract

The design of a unique, state-of-the-art voltage source (Vs) is described. It is a subsystem of a VLSI tester, and powers the device under test (DUT). It is fully programmable and has extensive measurement capabilities. Its ratings include zero to 6 volts output at 50 amps per circuit board, 300 Amps maximum, with an under 1 /spl mu/sec response time to transient loads.