A Memristor-based Quaternary Memory with Adaptive Noise Tolerance

Arezoo Dabaghi Zarandi, A. Rubio, M. R. Reshadinezhad
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Abstract

Considering the constraints of CMOS technology progress at the nano-domain, memristor technology is one of the preferred alternatives to merge with and substitute CMOS-based memory circuits. At the same time to increase the bandwidth of memories, increase storage density and decrease the interconnection complexity of circuits, multiple-valued logic (MVL) based circuit memories are being introduced as an efficient alternative. As resistive random access memory (ReRAM) is a non-volatile memory and memristor cells allow analog multilevel behavior, they are suitable device to store multiple-level bits of information. Different sources of noise and perturbances may affect the original values of data during the transferring and storing processes. A hybrid scenario based on CMOS and memristor technology is proposed here to recover the stored multiple noisy-perturbed values of resistive random-access memory in an efficient way. To show the correctness of the proposed method, affected images are simulated with Matlab software at system level showing its efficiency.
基于忆阻器的自适应噪声容限四元存储器
考虑到CMOS技术在纳米领域发展的限制,忆阻器技术是与CMOS存储电路融合和替代的首选方案之一。同时,为了增加存储器的带宽,增加存储密度和降低电路互连的复杂性,基于多值逻辑(MVL)的电路存储器作为一种有效的替代方案被引入。由于电阻式随机存取存储器(ReRAM)是一种非易失性存储器,并且忆阻器单元允许模拟多电平行为,因此它们是存储多电平信息的合适器件。在传输和存储过程中,不同来源的噪声和扰动可能会影响数据的原始值。本文提出了一种基于CMOS和忆阻器技术的混合方案,以有效地恢复存储在电阻式随机存储器中的多个噪声扰动值。为了验证该方法的正确性,用Matlab软件对受影响的图像进行了系统级仿真,验证了该方法的有效性。
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