{"title":"Development of an Instrument in Transformer Winding Distortion Measurement Based on Artificial Neural Network and S3C2410","authors":"Liu Jun, Zhao Xueliang, Feng Jianhua, Wang Lei","doi":"10.1109/ICACTE.2008.91","DOIUrl":null,"url":null,"abstract":"Taking an instrument in transformer winding distortion measurement as an example, a solution is proposed based on Samsung's S3C2410 processor and embedded Linux operating system Hardware design is introduced, and software design also is described. The application of the artificial neural network technique to the frequency response analysis method (FRA) which is used to detect transformer winding deformation is presented. The system has wide application prospect with the advantages of small volume, low cost, high reliability, etc.","PeriodicalId":364568,"journal":{"name":"2008 International Conference on Advanced Computer Theory and Engineering","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Conference on Advanced Computer Theory and Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICACTE.2008.91","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Taking an instrument in transformer winding distortion measurement as an example, a solution is proposed based on Samsung's S3C2410 processor and embedded Linux operating system Hardware design is introduced, and software design also is described. The application of the artificial neural network technique to the frequency response analysis method (FRA) which is used to detect transformer winding deformation is presented. The system has wide application prospect with the advantages of small volume, low cost, high reliability, etc.