Reliability Analysis of CMOS Rambus Oscillator under Device Mismatch Effects

Ibtissem Seghaier, S. Tahar
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引用次数: 1

Abstract

This paper introduces an approach that uses transient sensitivity analysis and state space verification to assess the reliability of Rambus oscillators due to device mismatch. The transient sensitivity analysis aims to truncate the high dimensional parameter variations space into a reduced subspace. Thereafter, a phase-space pattern matching verification approach is performed on this reduced subspace to estimate the yield rate using new measures called Recurrence Rate and Recurrence Periodicity Entropy. The proposed approach is illustrated on a four stage CMOS Rambus oscillator. The obtained results demonstrate a far faster yield assessment with a superior accuracy compared to Monte Carlo technique.
器件失配效应下CMOS Rambus振荡器可靠性分析
本文介绍了一种利用瞬态灵敏度分析和状态空间验证来评估器件失配引起的Rambus振荡器可靠性的方法。暂态灵敏度分析的目的是将高维参数变化空间截断为约简子空间。然后,在此简化子空间上执行相空间模式匹配验证方法,使用称为递归率和递归周期熵的新度量来估计良率。该方法在一个四级CMOS Rambus振荡器上进行了说明。所得结果表明,与蒙特卡罗技术相比,产量评估速度要快得多,精度更高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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