Reliability Analysis of CMOS Rambus Oscillator under Device Mismatch Effects

Abstract

This paper introduces an approach that uses transient sensitivity analysis and state space verification to assess the reliability of Rambus oscillators due to device mismatch. The transient sensitivity analysis aims to truncate the high dimensional parameter variations space into a reduced subspace. Thereafter, a phase-space pattern matching verification approach is performed on this reduced subspace to estimate the yield rate using new measures called Recurrence Rate and Recurrence Periodicity Entropy. The proposed approach is illustrated on a four stage CMOS Rambus oscillator. The obtained results demonstrate a far faster yield assessment with a superior accuracy compared to Monte Carlo technique.