ZnMgO-based UV photodiodes: a comparison of films grown by spray pyrolysis and MBE

SPIE OPTO Pub Date : 2016-03-15 DOI:10.1117/12.2213697
A. Hierro, G. Tabares, M. López-Ponce, J. Ulloa, A. Kurtz, E. Muñoz, V. Marín-Borrás, V. Muñoz-Sanjosé, J. Chauveau
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引用次数: 4

Abstract

Detecting the UV part of the spectrum is fundamental for a wide range of applications where ZnMgO has the potential to play a central role. The shortest achievable wavelength is a function of the Mg content in the films, which in turn is dependent on the growth technique. Moreover, increasing Mg contents lead to an electrical compensation of the films, which directly affects the responsivity of the photodetectors. In addition, the metal-semiconductor interface and the presence of grain boundaries have a direct impact on the responsivity through different gain mechanisms. In this work, we review the development of ZnMgO UV Schottky photodiodes using molecular beam epitaxy and spray pyrolysis, and we analyze and compare the physical mechanisms underlying the photodetector behavior.
znmgo基紫外光电二极管:喷雾热解和MBE生长薄膜的比较
检测光谱的紫外部分是广泛应用的基础,其中ZnMgO具有发挥核心作用的潜力。可达到的最短波长是薄膜中Mg含量的函数,而Mg含量又取决于生长技术。此外,Mg含量的增加会导致薄膜的电补偿,直接影响光电探测器的响应性。此外,金属-半导体界面和晶界的存在通过不同的增益机制对响应度有直接影响。在这项工作中,我们回顾了利用分子束外延和喷雾热解制备ZnMgO紫外肖特基光电二极管的进展,并分析和比较了光电探测器行为的物理机制。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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