Self-testing of analog parts of mixed-signal electronic microsystems based on multiple sampling of time responses

Abstract

A new approach to self-testing of analog parts terminated by ADCs in mixed-signal electronic microsystems controlled by microcontrollers is presented. It bases on a new fault diagnosis method using a transformation of the set of voltage samples of the time response of a tested analog part to a square impulse into identification curves placed in a measurement space. The method can be used for fault detection and single soft fault localization. Modified DFT formulas are used for conversion of the measurement results to the form used by the fault detection and localization algorithm and also for creation of the fault dictionary.