Thermal-HIL Real-Time Testing Platform for Evaluating Cooling Systems of Power Rectifiers

C. N. Ho, Ying Fang, Yanming Xu, Isuru Jayawardana
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Abstract

In this paper, a novel Thermal-Hardware-in-the-Loop (T-HIL) cooling system evaluating platform is proposed. The platform consists of a physical cooling system, which is used to be evaluated or characterized, hardware-software interfaces, and real-time simulation models for a power semiconductor. The hardware and software are connected and interacted in real-time. Thus, the platform can test the dynamic performance of the physical cooling system by inputting minimum energy. The power semiconductor is modeled in a software environment, and it is easy to change types of power semiconductors. It can effectively reduce R&D costs and provide a safe testing environment for engineers to evaluate or characterize cooling systems. The individual components in the proposed T-HIL system are studied and experimentally verified by the T-HIL system prototype. Moreover, the overall system evaluation results show that the proposed system can simulate power semiconductor losses and has good agreement with the theoretical findings.
功率整流器冷却系统的热- hil实时测试平台
本文提出了一种新型的热硬件在环(T-HIL)冷却系统评估平台。该平台由物理冷却系统(用于评估或表征)、硬件软件接口和功率半导体的实时仿真模型组成。硬件和软件是实时连接和交互的。因此,该平台可以通过最小的能量输入来测试物理冷却系统的动态性能。在软件环境中对功率半导体进行建模,易于更改功率半导体的类型。它可以有效地降低研发成本,并为工程师评估或表征冷却系统提供安全的测试环境。通过T-HIL系统原型对所提出的T-HIL系统中的各个组件进行了研究和实验验证。系统总体评估结果表明,所提出的系统能够模拟功率半导体的损耗,与理论结果吻合较好。
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