C. Lai, C. Lee, A. Chin, C. Zhu, M. Li, S. Mcalister, D. Kwong
{"title":"A tunable and program-erasable capacitor on Si with excellent tuning memory","authors":"C. Lai, C. Lee, A. Chin, C. Zhu, M. Li, S. Mcalister, D. Kwong","doi":"10.1109/RFIC.2004.1320589","DOIUrl":null,"url":null,"abstract":"A novel tunable and program-erasable high-/spl kappa/ AlN MIS capacitor is demonstrated for the first time with excellent tuning memory, which is useful to tune the impedance mismatching and resonance frequency without always having a connected voltage bias circuit. A large C/sub max//C/sub min/ tunability of 12 is obtained due to the high-/spl kappa/ AlN dielectric with high 5 /spl mu/F//spl mu/m/sup 2/ capacitance density. Good tuning memory is evidenced from the small V/sub th/ variation after program or erase at +4 V or -4 V for 10,000 s and the potential of years long extrapolated memory time.","PeriodicalId":140604,"journal":{"name":"2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIC.2004.1320589","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
A novel tunable and program-erasable high-/spl kappa/ AlN MIS capacitor is demonstrated for the first time with excellent tuning memory, which is useful to tune the impedance mismatching and resonance frequency without always having a connected voltage bias circuit. A large C/sub max//C/sub min/ tunability of 12 is obtained due to the high-/spl kappa/ AlN dielectric with high 5 /spl mu/F//spl mu/m/sup 2/ capacitance density. Good tuning memory is evidenced from the small V/sub th/ variation after program or erase at +4 V or -4 V for 10,000 s and the potential of years long extrapolated memory time.