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Controlling the explosion of a high-current-density conductor through the addition of micron-scale surface defects.

Proposed for presentation at the 2021 IEEE Pulsed Power Conference (Virtual) held December 12-16, 2021 in , Pub Date : 2021-11-01 DOI:10.2172/1899265
T. Awe, E. Yu, M. Hatch, K. Tomlinson, W. Tatum, K. Yates, B. Hutsel, B. Bauer
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通过添加微米级表面缺陷来控制高电流密度导体的爆炸。
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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Proposed for presentation at the 2021 IEEE Pulsed Power Conference (Virtual) held December 12-16, 2021 in ,
Proposed for presentation at the 2021 IEEE Pulsed Power Conference (Virtual) held December 12-16, 2021 in ,
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