TEDL-a new test interface standard from the IEEE

Abstract

Earlier this year, the IEEE approved a new test interface standard called IEEE Std 993-Test Equipment Description Language (TEDL). For many years, industry has bridged the gap between test language standards, such as ATLAS and instrumentation standards such as GPIB and VXI, using non standard terminology. This new standard will provide a standard interface between test specifications on the one hand and instrumentation control on the other hand. The purpose of this paper is: (i) to describe the new TEDL standard; (ii) to highlight areas where TEDL could be used; (iii) to explain the way forward and future development of the standard. The TEDL Standard. This section of the paper will define the layered approach adopted and describe the three basic TEDL models, namely the Adaptation Model (AM), the Configuration Model (CM) and the Device Model (DM). The AM is the logical model for describing the interconnection between the ATE interface, the adapter devices (if any) and the UUT interface. One AM is typically associated with each adapter. The CM is the logical model for identifying the elements of an ATE, as well as describing their interconnection and intercommunication in the test environment One CM is associated with each ATE. The primary purpose of the DM is to provide a description of the capabilities of the ATE and adapter devices and to define how these devices are controlled. One DM is necessary for each different device associated with an ATE. TEDL will be used as an integral part of an ATE Software System where test programs written in ATLAS (or equivalent signal orientated language) are compiled, translated or interpreted into commands that control the ATE instrumentation.