Modeling of brownian-bridge-based analysis of the segmental D/A converters yield

Abstract

According to the stochastic process of Brownian bridge theory, a DAC model of INL and segment ratio is presented based on the INL probability density for segmental current-steering DAC. The approximate formula for influence of chip yield in the current mismatch is obtained and the model is carried out by Monte Carlo simulation method. It is demonstrated that DAC yield is lower compared using thermometer-code to using binary-code in the low-bits. When transform bits N<12, the greater binary-code(>[N/2]), the higher yield. Binary-code bits is not suitable for large when N≥12.