Methods for RFSOI Damascene Tungsten Contact Etching

D. Vaughn, Felix P. Anderson, R. Meunier, T. Doan, A. Stamper
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Abstract

GLOBALFOUNDRIES has ramped its 180nm generation RFSOI foundry technology into high volume production at multiple 200mm and 300mm fabricators. This RFSOI technology was optimized primarily for sub-6GHz RF switches, tuners, and low noise amplifiers used in cell phone front-end-modules. The thin SOI wafer top silicon layer presents challenges in contact etching and this paper summarizes the optimization of contact etching to significantly reduce the final contact dielectric thickness consumption and improve copper M1 wire to FET gate polysilicon (M1-Poly) shorting yield.
RFSOI Damascene钨接触蚀刻方法
GLOBALFOUNDRIES已经将其180nm一代RFSOI代工技术投入到多个200mm和300mm制造商的大批量生产中。RFSOI技术主要针对手机前端模块中使用的6ghz以下射频开关、调谐器和低噪声放大器进行了优化。薄SOI晶圆顶部硅层在接触蚀刻方面存在挑战,本文总结了优化接触蚀刻的方法,以显著降低最终接触介质厚度消耗,提高铜M1线到FET栅极多晶硅(M1- poly)的短路率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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