{"title":"Frequency comb generator for calibration of laser frequency standards","authors":"M. Merimaa, K. Nyholm, M. Vainio","doi":"10.1109/LEOSST.2005.1528008","DOIUrl":null,"url":null,"abstract":"We describe the frequency comb generator at MIKES, with which laser frequency standards at 633 nm and 532 nm were measured. Frequencies were found to be within 0.2 kHz from the CIPM values for R(56)32-0 a/sub 10/ and R(127)11-5 a/sub 16/. An optical amplifier was developed for measurement of 633 nm standards.","PeriodicalId":410276,"journal":{"name":"Digest of the LEOS Summer Topical Meetings, 2005.","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of the LEOS Summer Topical Meetings, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LEOSST.2005.1528008","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We describe the frequency comb generator at MIKES, with which laser frequency standards at 633 nm and 532 nm were measured. Frequencies were found to be within 0.2 kHz from the CIPM values for R(56)32-0 a/sub 10/ and R(127)11-5 a/sub 16/. An optical amplifier was developed for measurement of 633 nm standards.