Raman spectroscopy of Mg-doped gallium nitride: shift of the A/sub 1/(LO) phonon

J. C. Burton, S. Cohen, S. J. Lukacs, F. H. Long, S. Liang, Y. Lu, Y. Li, C. Tran
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Abstract

For the development of improved devices, the control and understanding of the electrical properties of nitride semiconductors is essential. Although significant progress has been made in recent years, the p-type doping of nitride semiconductors has proven to be challenging. It has been found necessary to anneal the sample after growth at moderate (700/spl deg/C-900/spl deg/C) temperatures in order to electrically activate the dopants. In order to help in the development of improved p-type doped GaN and other group III-nitrides, we have undertaken a study of the Raman spectroscopy of p-type doped GaN under a variety of processing conditions.
掺镁氮化镓的拉曼光谱:A/sub /(LO)声子的位移
为了改进器件的发展,对氮化半导体电性能的控制和理解是必不可少的。虽然近年来取得了重大进展,但氮化半导体的p型掺杂已被证明是具有挑战性的。为了电激活掺杂剂,有必要在中等温度(700/spl°C-900/spl°C)下对生长后的样品进行退火。为了帮助改进p型掺杂GaN和其他iii族氮化物的开发,我们在各种加工条件下进行了p型掺杂GaN的拉曼光谱研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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