{"title":"Impact of polymer stabilization compounds in EVA encapsulation foils on long-term module performance","authors":"I. Sinicco, T. Schuhmacher, K. Proost","doi":"10.1117/12.894616","DOIUrl":null,"url":null,"abstract":"It is known that one of the main functions of an encapsulation foil is to protect the module against external aging factors. But, what about the impact of the lamination foil itself on module reliability? In this study we will focus on EVA based lamination foils and the impact caused by some chemicals contained in such foils on the module performance. Special attention will be devoted to the effect of standard components like HALS (hindered amine light stabilizer), peroxides, UV blockers, the acidity of the master batch and different bulk EVA on reliability of thin film silicon modules. Due to environmental factors, free radicals can be formed inducing degradation effects. The impact on reliability will be studied.","PeriodicalId":140444,"journal":{"name":"Optics + Photonics for Sustainable Energy","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics + Photonics for Sustainable Energy","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.894616","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
It is known that one of the main functions of an encapsulation foil is to protect the module against external aging factors. But, what about the impact of the lamination foil itself on module reliability? In this study we will focus on EVA based lamination foils and the impact caused by some chemicals contained in such foils on the module performance. Special attention will be devoted to the effect of standard components like HALS (hindered amine light stabilizer), peroxides, UV blockers, the acidity of the master batch and different bulk EVA on reliability of thin film silicon modules. Due to environmental factors, free radicals can be formed inducing degradation effects. The impact on reliability will be studied.