Vapor HF sacrificial etching for phosphorus doped polycrystalline silicon membrane structures

H. Cao, R. Weber
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引用次数: 7

Abstract

In this work we present a technique using HF vapor to release phosphorus doped polycrystalline silicon (Phos-Poly) circular membrane structures. A 2 um thick annealed phosphosilicate glass (PSG) has been used as the sacrificial layer. The sacrificial etching was followed by solvent rinses and Critical Point Drying (CPD) to remove any residual HF and to avoid sticition. A Phos-Poly diaphragm with a diameter of 106 um has been successfully released as well as some membrane arrays. This technique has been proved very simple and effective. The membrane structures can be used in pressure sensing applications.
磷掺杂多晶硅膜结构的气相HF牺牲蚀刻
在这项工作中,我们提出了一种利用HF蒸气释放磷掺杂多晶硅(Phos-Poly)圆形膜结构的技术。牺牲层采用2um厚的退火磷硅酸盐玻璃(PSG)。牺牲蚀刻之后是溶剂冲洗和临界点干燥(CPD),以去除任何残留的HF并避免收缩。已经成功地释放了直径为106微米的Phos-Poly薄膜以及一些膜阵列。这个方法已经被证明是非常简单和有效的。膜结构可用于压力传感应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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