VEBoC: Variation and error-aware design for billions of devices on a chip

Shoaib Akram, S. Cromar, Gregory Lucas, Alexandros Papakonstantinou, Deming Chen
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Abstract

Billions of devices on a chip is around the corner and the trend of deep submicron (DSM) technology scaling will continue for at least another decade. Meanwhile, designers also face severe on-chip parameter variations, soft/hard errors, and high leakage power. How to use these billions of devices to deliver power-efficient, high-performance, and yet error-resilient computation is a challenging task. In this paper, we attempt to demonstrate some of our perspectives to address these critical issues. We elaborate on variation-aware synthesis, holistic error modeling, reliable multicore, and synthesis for application-specific multicore. We also present some of our insights for future reliable computing.
VEBoC:芯片上数十亿设备的变化和错误感知设计
数十亿个设备在一个芯片上即将到来,深亚微米(DSM)技术的扩展趋势将至少持续十年。同时,设计人员还面临着严重的片内参数变化、软/硬误差、高泄漏功率等问题。如何使用这些数十亿的设备来提供节能、高性能和容错的计算是一项具有挑战性的任务。在本文中,我们试图展示我们的一些观点来解决这些关键问题。我们详细阐述了变化感知综合、整体误差建模、可靠的多核和针对特定应用的多核综合。我们还提出了我们对未来可靠计算的一些见解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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