A comparison of quasi-static characteristics and failure signatures of GMR heads subjected to CDM and HBM ESD events

C. Moore
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引用次数: 2

Abstract

The effects of the human body model (HBM) electrostatic discharge (ESD) waveform on giant magnetoresistive (GMR) heads is fairly well characterized. This information provides a baseline against which a comparison can be made for other ESD models. The goal of this work is to compare and contrast the effects that are seen in GMR sensors when they are subjected to the charged-device model (CDM) versus HBM ESD events. This study compares the effects of CDM waveforms versus HBM waveforms on a single design of MR head. Although the HBM waveform has provided a starting point for understanding ESD damage to GMR heads, it is believed that the CDM model has a more useful basis in the reality of head manufacturing. This makes study of the effects of CDM ESD events on GMR heads both important and interesting. Detailed characterization of head response as a function of the ESD waveform was realized using a new system combining quasi-static (QST) analysis with in-situ CDM and HBM ESD simulation capabilities. A SEM was used to perform failure analysis on damaged heads in an attempt to characterize differences in the "failure signature" of the sensor.
GMR磁头在CDM和HBM ESD事件下的准静态特性和失效特征的比较
研究了人体模型(HBM)静电放电(ESD)波形对巨磁阻(GMR)磁头的影响。该信息为其他ESD模型的比较提供了基准。这项工作的目的是比较和对比GMR传感器在受到充电器件模型(CDM)和HBM ESD事件时所看到的效果。本研究比较了CDM波形与HBM波形对单个磁流变头设计的影响。虽然HBM波形为理解ESD对GMR磁头的损伤提供了一个起点,但人们认为CDM模型在磁头制造的现实中具有更有用的基础。这使得研究CDM ESD事件对GMR磁头的影响变得既重要又有趣。利用准静态(QST)分析与原位CDM和HBM ESD仿真功能相结合的新系统,实现了头部响应作为ESD波形函数的详细表征。扫描电镜被用来对损坏的头部进行失效分析,试图表征传感器“失效特征”的差异。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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